Improving the SThM accuracy in measuring thin films and bulk materials (...) | 2021NSFEurope
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 Published On May 3, 2022

NSFE series is an open European AFM User Forum focusing on sharing and exchanging the cutting-edge research for both materials and life science disciplines using Atomic Force Microscopy (AFM).

The research focus of the 4th NSFE 2021 was laid on wide range of SPM applications and methods such as nanoelectronics, photovoltaics, semiconductive materials, nano- and biomaterials, single molecule research, electrochemistry, innovative methods in nanotechnology and correlative microscopy.

Title: Improving the SThM accuracy in measuring thin films and bulk materials thermal conductivity

Speaker: Dr. Claudiu Hapenciuc, National Institute for Lasers Plasma and Radiation Physics, Romania

Learn more about NSFE: https://www.nanoscientificforum.com/


#2021NSFEurope #SPM #AFM

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